Method for measuring thermal contact resistance of graphite thin film materials
نویسندگان
چکیده
منابع مشابه
Universal point contact resistance between thin-film superconductors
Michael Hermele,1 Gil Refael,2 Matthew P. A. Fisher,3 and Paul M. Goldbart4 1Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA 2Department of Physics, California Institute of Technology, Pasadena, California 91125, USA 3Kavli Institute for Theoretical Physics, University of California, Santa Barbara, California 93106, USA 4Department of Physics, U...
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ژورنال
عنوان ژورنال: Measurement
سال: 2016
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2016.07.015